Scanning Probe Microscopy can image surfaces at the nanometer scale.

Veeco Multimode Scanning Probe Microscope with Nanoscope IV Controller

The Veeco system can be used as an atomic force microscope (AFM) or a scanning tunnelling microscope (STM) and is capable capturing images with atomic resolution up to images about 100 µm by 100 µm.  The instrument also has many extra features and can image sample sunder liquid, at variable temperatures and with modified tips. The instrument is can operate in electrochemical, fast scanning and magnetic AC (MAC) modes as well as in force spectroscopy mode.

 

 

 

Novascan ESPM 3D Atomic Force Microscope and Optical Tweezer

This atomic force microscope from Novascan is mounted on a motorized inverted fluorescence microscope from Olympus  (IX81). The atomic force microscope system includes both open- and closed-loop scanners, a nanolithography mode and a variety of imaging modes. The maximum scan range is 120µm by 120µm in lateral dimensions and 8 µm in vertical dimensions. This atomic force microscope is particularly suited for high sensitivity force measurements. In addition, a single beam optical trap is mounted on the Olympus microscope. This optical tweezer is capable of piconewton resolution force measurements. Lastly, the Olympus microscope software include a module for particle tracking.

 

 

Witec Near-field Scanning Optical Microscope with Confocal Raman

The alpha300 S Scanning Near-field Optical Microscope features a Confocal Raman Microscope (CM), a Scanning Near-Field Optical Microscope (SNOM) and an Atomic Force Microscope (AFM) in a single instrument. By simply rotating the objective turret, the user can choose from among Confocal Microscopy, SNOM or AFM.   This is the only instrument of its type in Australia.

 

 

Vecco/Digital Instruments Nanoscope E AFM System

This older system is still used for contact mode imaging and collects very nice images.  It is ideal to quick imaging of hard samples.