Neutral impact collision ion scattering spectroscopy (NICISS) allows for depth profiling of a sample. This technique gives an elemental concentration profile to a depth of 10-420 nm, with a depth resolution close to 0.2 nanometres near the surface.
Instrument Leader: Professor Gunther Andersson
NICISS Facility Manager: Dr Liam Howard-Fabretto
NICISS can be used to construct an elemental concentration depth profile of the upper layers of a sample surface. It can be determined which elements are present on the upper-most layer of a surface, which can be useful for determining how a material will interact with its environment. This example shows that the anion was present on the sample surface, while the cation was present below the surface layer.
Demonstration of the ability for NICISS to measure the surfaces of liquid samples under vacuum. A rotating wheel moves through a liquid solution, creating a film of liquid on the wheel which is then analysed. Concentration depth profiles can therefore be measured for liquid surfaces, which can provide information about which ions are present on the liquid surface.
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