Materials characterisation - Flinders University

Dr Alex Sibley

NanoESCA III Photoemission Electron Microscope (PEEM)

The NanoESCA III Photoemission Electron Microscope (PEEM) images surfaces by focussing and detecting electrons emitted from a material following irradiation with UV and X-ray light. The primary capabilities include spatial mapping of the surface morphology, elemental and chemical compositions and the electron band-structure of the materials.

Excitation sources

Hg Lamp : 4.9-5.2 eV
HIS14 HD VUV: He(I/II) 21.22 / 40.80 eV
XR6 X-ray (monochromated Al Kα): 1486.7 eV

Capabilities

PEEM energy-filtered imaging (<50 nm)
XPEEM imaging (~50 nm)
Small-spot XPS and UPS (~500 nm to 200 µm)
Momentum Microscopy (MM)
Angle Resolved Photoelectron Spectroscopy (µARPES)

Liquid Helium-cooled sample stage

Sample temperatures in the range 20-400 K.

Sample preparation chamber

Low-energy electron diffraction (LEED)
Sample cleaning through ion sputtering
Crystal cleaving in-vacuo
Manipulator heating/cooling (120-880 K)

Sample cleaning through ion sputtering

Crystal cleaving in-vacuo
Manipulator heating/cooling (120-880 K)

Contact People

Dr Benjamin Chambers

Scanning Probe Microscope (SPM)

The Scienta Omicron Variable Temperature UHV SPM (VT AFM XA) is used to gain atomic resolution images of sample surfaces providing insight into surface morphology, topology, and the surface density of states at a range of temperatures (20K – 500K). Tips and samples are exchanged under UHV using the transfer arm and carousel. The instrument is connected the PEEM sample preparation chamber and can be used independently or in preparation for PEEM measurements.

Specifications

Scienta Omicron VT AFM XA

Capabilities

UHV Atomic Force Microscopy (AFM)
UHV Non Contact Force Microscopy (NCAFM)
UHV Scanning Tunnelling Microscopy (STM) (<1pA – 330nA)
UHV Scanning Tunnelling Spectroscopy (STS) (<1pA – 330nA)

Sample preparation

As per the Photoemission Electron Microscope.

Contact People

Dr Benjamin Chambers

Sputter Coater

Two sputter coaters are available for use. A single target unit is dedicated to sputtering samples for scanning electron microscopy (SEM) analysis. There is also a dual target sputtering system that is fully automatic, ideally suited for multilayer thin film applications. A range of metals including gold, silver, platinum, titanium and chromium are available.

Training requirements

In person training to be completed with relevant staff.

Contact person

Dr Alex Sibley

View dual target sputter coater booking calendar

View single target sputter coater calendar

Metastable Induced Electron Spectroscopy (MIES)
*CUSTOM BUILT

The instrument allows for applying four different electron spectroscopy techniques; each technique can be applied independently. Metastable Induced Electron Spectroscopy (MIES) is a technique that is exclusively surface sensitive. This technique probes the valence orbitals of only the outermost layer of atoms, allowing for the determination of molecule orientation. This technique can be paired with three more electron spectroscopy techniques probing occupied and unoccupied states at various depth: Ultraviolet Photoelectron Spectroscopy (UPS), Inverse Photemission Spectroscopy (IPES) and X-ray Photoelectron Spectroscopy (XPS).

Specifications

Custom built in collaboration with SPECS.

Training requirements

In person training to be completed with relevant staff.

Contact people

Dr Liam Howard-Fabretto

Professor Gunther Andersson

Funded by Microscopy Australia and the Australian National Fabrication Facility

Professor Gunther Andersson

Neutral Impact Collision Ion Scattering Spectroscopy (NICISS)
*CUSTOM BUILT

Neutral Impact Collision Ion Scattering Spectroscopy (NICISS) allows for depth profiling of a sample. This technique gives an elemental concentration profile to a depth of 10-40 nanometres, with a depth resolution close to 0.3 nm near the surface. NICISS can be applied to solid samples, polymers and liquids.

Specifications

Custom built in collaboration with SPECS.

Training requirements

In person training to be completed with relevant staff.

Contact people

Dr Liam Howard-Fabretto

Funded by the Australian National Fabrication Facility

Atomic Force Microscopy (AFM)

Atomic Force Microscopy (AFM) is used to gain topographic information on a sample. Our AFM facilities are also able to map sample conductivity on the nanoscale, characterise stiffness and adhesion in air and fluid environments, and monitor dynamic changes in surfaces with our fast-scanning AFM, which is capable of acquiring images over 100 times faster than a conventional AFM.

Specifications

Multimode 8 AFM with Nanoscope V controller

Dimension FastScan AFM with Nanoscope V controller

Training requirements

In person training to be completed with relevant staff, complemented by online modules through MyScope, instructional training videos and tests.

Contact person

Dr Chris Gibson

View the standard AFM booking calendar

View the AFM with conductivity mapping booking calendar

View the fast scan AFM booking calendar

Raman Microscopy Facility

Our labs are equipped with two confocal Raman microscopes capable of acquiring single Raman spectra—and also confocal Raman—imaging. The maximum possible lateral resolution for confocal Raman images at the laser excitation wavelength of 532 nm is approximately 360 nm. Several excitation wavelengths are available, including 532, 632 and 785 nm. A selection of gratings is also available from 600 grooves/mm up to 2400 grooves/mm.

Tip Enhanced Raman Spectroscopy (TERS) combines a surface probe with Raman spectroscopy, allowing for chemical mapping of a surface down to a few tens of nanometres. The laser excitation wavelength is 532 nm.

Specifications

Witec alpha300R confocal Raman microscope (2008)

Witec alpha300RAS Raman microscope (2022)

XplorRA Horiba Scientific confocal Raman microscope

Training requirements

In person training to be completed with relevant staff.

Contact person

For the Witec alpha300R confocal Raman microscope and Witec alpha300RAS Raman microscope please contact Dr Chris Gibson

For the XplorRA Horiba Scientific confocal Raman microscope and TERS please contact Dr. Jason Gascooke

View Witec alpha300R confocal Raman microscope (2008) booking calendar

View Witec alpha300RAS Raman microscope (2022) booking calendar

View XploRA Horiba Scientific confocal Raman microscope and TERS booking calendar

X-ray Diffraction (XRD)

X-ray Diffraction (XRD) is a characterization technique used for examining the crystal structure of all materials. The instrument is a Bragg-Brentano geometry X-ray Diffractometer (XRD) with a cobalt X-ray source. It is ideal for qualitative phase identification, quantitative phase analysis and the determination of crystal structure. The cobalt source allows this instrument to accurately analyse high iron content samples. In addition to this, the instrument is equipped with a capillary stage for the measurement of a very small amount of sample. It is also useful for spinning samples that have issues due to high absorbances or texture effects. Data analysis capabilities for XRD include the use of the ICDD PDF-2 Database, DIFFRAC. EVA Software for phase identification as well as the Topas software package (Rietveld refinement method) for crystal structure determination and quantitative phase analysis.

Specifications

Bruker D8 Advance Eco

Training requirements

In person training to be completed with relevant staff.

Contact person

Dr. Alex Sibley

Electronic structure simulation and materials modelling

To understand properties of materials and reactions at surfaces, we complement our spectromicroscopy data with ab initio simulations using high-performance computing together with a suite of theoretical methods. Extensive developments in density functional theory (DFT), many-electron wave function theory and graphics processing unit (GPU) technology have made it possible to accurately predict bulk crystal structures and surface morphologies.

Contact person

Dr. Tanglaw Roman

Make a booking

Scanning Auger Nanoprobe

The Scanning Auger Nanoprobe is one of only two in Australia and is able to map chemical information across a surface. This instrument combines microscopy with the ability to determine elemental composition, resulting the analysis of surface chemistry with a spatial resolution of 10 nanometres.

Specifications

PHI-710 AES

Training requirements

In person training to be completed with relevant staff.

Contact people

Dr Alex Sibley

Professor Gunther Andersson

Bruker VERTEX 80v UHV FTIR

The VERTEX 80v is a highly-equipped FTIR which can be used to identify organic, polymeric, and inorganic materials. Infrared light is used to scan test samples, producing spectra containing molecular ‘fingerprints’. The VERTEX 80v is an evacuated optics bench, allowing for the elimination of atmospheric moisture from spectra for ultimate sensitivity.

Special features of this instrument include an extended wavelength range from near- to far-IR, multiple detectors (ATR, integrating sphere, and others) for measuring a range of solid/powder/liquid samples, and ultra-high vacuum compatibility with the MIES instrument for performing in situ IR reflectance measurements.

Specifications

Bruker VERTEX 80v

In situ UHV-compatible

Training requirements

In person training to be completed with relevant staff.

Contact people

Dr Liam Howard-Fabretto

Associate Professor Egon Perilli

Large-Volume Micro-CT System

The large-volume micro-CT scanner will allow 3D scanning of large and heavy samples. This includes whole machine parts, human and animal limbs or segments, biomaterials, prosthesis devices, large animals and vertebrates, fossils and plant root systems for research and industrial applications. This allows experimental testing rigs, such as mechanical stages or environmental chambers, to be placed inside the scanner (in situ testing), for testing samples while scanning.

Specifications

Nikon XT H 225ST CT Scanner

In situ testing stages

The following mechanical testing stages are available for use with the micro-CT system, allowing tensile and compressive loading of the specimen while scanning:

An in house-built stage (20kN load cell)

A customised stage (5kN load cell, Deben CT5000N)

Training requirements

Please contact staff below.

Contact People

Dr Sophie Rapagna