Sputter Coater

Two sputter coaters are available for use. A single target unit is dedicated to sputtering samples for scanning electron microscopy (SEM) analysis. There is also a dual target sputtering system that is fully automatic, ideally suited for multilayer thin film applications. A range of metals including gold, silver, platinum, titanium and chromium are available.

Training requirements

In person training to be completed with relevant staff.

Contact person

Dr Alex Sibley

Metastable Induced Electron Spectroscopy (MIES)
*CUSTOM BUILT

The instrument allows for applying four different electron spectroscopy techniques; each technique can be applied independently. Metastable Induced Electron Spectroscopy (MIES) is a technique that is exclusively surface sensitive. This technique probes the valence orbitals of only the outermost layer of atoms, allowing for the determination of molecule orientation. This technique can be paired with three more electron spectroscopy techniques probing occupied and unoccupied states at various depth: Ultraviolet Photoelectron Spectroscopy (UPS), Inverse Photemission Spectroscopy (IPES) and X-ray Photoelectron Spectroscopy (XPS).

Specifications

Custom built in collaboration with SPECS.

Training requirements

In person training to be completed with relevant staff.

Contact people

Dr Liam Howard-Fabretto

Professor Gunther Andersson

Funded by Microscopy Australia and the Australian National Fabrication Facility

Neutral Impact Collision Ion Scattering Spectroscopy (NICISS)
*CUSTOM BUILT

Neutral Impact Collision Ion Scattering Spectroscopy (NICISS) allows for depth profiling of a sample. This technique gives an elemental concentration profile to a depth of 10-40 nanometres, with a depth resolution close to 0.3 nm near the surface. NICISS can be applied to solid samples, polymers and liquids.

Specifications

Custom built in collaboration with SPECS.

Training requirements

In person training to be completed with relevant staff.

Contact people

Dr Liam Howard-Fabretto

Professor Gunther Andersson

Funded by the Australian National Fabrication Facility

Atomic Force Microscopy (AFM)

Atomic Force Microscopy (AFM) is used to gain topographic information on a sample. Our AFM facilities are also able to map sample conductivity on the nanoscale, characterise stiffness and adhesion in air and fluid environments, and monitor dynamic changes in surfaces with our fast-scanning AFM, which is capable of acquiring images over 100 times faster than a conventional AFM.

Specifications

Multimode 8 AFM with Nanoscope V controller

Dimension FastScan AFM with Nanoscope V controller

Training requirements

In person training to be completed with relevant staff, complemented by online modules through MyScope, instructional training videos and tests.

Contact person

Dr Chris Gibson

Raman Microscopy Facility

Our labs are equipped with two confocal Raman microscopes capable of acquiring single Raman spectra—and also confocal Raman—imaging. The maximum possible lateral resolution for confocal Raman images at the laser excitation wavelength of 532 nm is approximately 360 nm. Several excitation wavelengths are available, including 532, 632 and 785 nm. A selection of gratings is also available from 600 grooves/mm up to 2400 grooves/mm.

Tip Enhanced Raman Spectroscopy (TERS) combines a surface probe with Raman spectroscopy, allowing for chemical mapping of a surface down to a few tens of nanometres. The laser excitation wavelength is 532 nm.

Specifications

WITec alpha300R confocal Raman microscope

XplorRA Horiba Scientific confocal Raman microscope

Training requirements

In person training to be completed with relevant staff.

Contact person

For the Witec alpha300R confocal Raman microscope please contact Dr Chris Gibson

For the XplorRA Horiba Scientific confocal Raman microscope and TERS please contact Dr. Jason Gascooke

X-ray Diffraction (XRD)

X-ray Diffraction (XRD) is a characterization technique used for examining the crystal structure of all materials. The instrument is a Bragg-Brentano geometry X-ray Diffractometer (XRD) with a cobalt X-ray source. It is ideal for qualitative phase identification, quantitative phase analysis and the determination of crystal structure. The cobalt source allows this instrument to accurately analyse high iron content samples. In addition to this, the instrument is equipped with a capillary stage for the measurement of a very small amount of sample. It is also useful for spinning samples that have issues due to high absorbances or texture effects. Data analysis capabilities for XRD include the use of the ICDD PDF-2 Database, DIFFRAC. EVA Software for phase identification as well as the Topas software package (Rietveld refinement method) for crystal structure determination and quantitative phase analysis.

Specifications

Bruker D8 Advance Eco

Training requirements

In person training to be completed with relevant staff.

Contact person

Dr. Alex Sibley