Scanning Electron Microscopy (SEM) uses a beam of electrons to image at a sub-micron resolution – much higher than is possible with an optical microscope. The electron beam interacts with the atoms in the sample and causes several different signals to be emitted. This allows High resolution SEM images to be combined with elemental mapping using Energy Dispersive X-ray spectroscopy (EDX) or with crystal grain orientation and boundary mapping using Electron Backscatter Diffraction (EBSD).
Instrument Leader: Professor Sarah Harmer
SEM Facility Manager: Dr Alexander Sibley
FEI Inspect F50 Field Emission SEM
Sample coating facility also available
Samples must be solid, dry, conductive (facility available for surface coating). Sample size up to 100mm x and y, 40mm z
SEM image of a steel particle on a polished steel surface. The grain structure of the steel can be seen in the background, while the particle itself has it’s own microstructure.
EBSD Map of a polished titanium oxide surface – different colours show different orientations of the crystal structure
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