Scanning Electron Microscopy (SEM) uses a beam of electrons to image at a sub-micron resolution – much higher than is possible with an optical microscope. The electron beam interacts with the atoms in the sample and causes several different signals to be emitted. This allows High resolution SEM images to be combined with elemental mapping using Energy Dispersive X-ray spectroscopy (EDX) or with crystal grain orientation and boundary mapping using Electron Backscatter Diffraction (EBSD).
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